VTSYIQI DL type probe impact device for Leeb Hardness Tester
VTSYIQI DL type probe impact device for Leeb Hardness Tester
常规价格
$371.00 USD
常规价格
促销价
$371.00 USD
单价
单价
结账时计算的运费。
无法加载取货服务可用情况
Product Description
Leeb Hardness Tester DL Impact Device Probe For Slender Narrow Groove or Hole
