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VTSYIQI G Type Probe Impact Device for Leeb Hardness Tester

VTSYIQI G Type Probe Impact Device for Leeb Hardness Tester

常规价格 $270.00 USD
常规价格 促销价 $270.00 USD
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Product Description

Impacting energy Mass of impact body : 90mJ

Mass of impact body:20.0g

Test tip Hardness Diameter of test tip:1600HV

Material of test tip:5mm Tungsten carbide

Impact device Diameter:30mm

Impact device Length:254mm

Impact device Weight:250g

Max. hardness of workpiece:650HB

Mean roughness of workpiece surface of the Ra:6.3μm

Min. weight of sample Measure directly:>15kg

Need support firmly:5~15kg

Need coupling tightly:0.5~5kg

Min. thickness of sample coupling tightly:10mm

Min.layer thickness for surface harden:≥1.2mm

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