VTSYIQI G Type Probe Impact Device for Leeb Hardness Tester
VTSYIQI G Type Probe Impact Device for Leeb Hardness Tester
常规价格
$270.00 USD
常规价格
促销价
$270.00 USD
单价
/
单价
Product Description
Impacting energy Mass of impact body : 90mJ
Mass of impact body:20.0g
Test tip Hardness Diameter of test tip:1600HV
Material of test tip:5mm Tungsten carbide
Impact device Diameter:30mm
Impact device Length:254mm
Impact device Weight:250g
Max. hardness of workpiece:650HB
Mean roughness of workpiece surface of the Ra:6.3μm
Min. weight of sample Measure directly:>15kg
Need support firmly:5~15kg
Need coupling tightly:0.5~5kg
Min. thickness of sample coupling tightly:10mm
Min.layer thickness for surface harden:≥1.2mm